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Group: suogroup - library [26 articles]

グループ suogroup のメンバーが最近追加した論文の一覧
  • Controlled nucleation of dislocations by a spatially localized stress field
    posted to no-tag by suo to the group suogroup on 2006-08-29 13:28:37 as **
  • Stresses and strains in lattice-mismatched stripes, quantum wires, quantum dots, and substrates in Si technology
    J. Appl. Phys., Vol. 79, No. 11. (1 June 1996), pp. 8145-8165.
    by SC Jain, HE Maes, K Pinardi, De Wolf
    posted to strainedsi stress by suo to the group suogroup on 2006-08-25 20:03:30 as ***
  • Kink Formation and Motion in Carbon Nanotubes at High Temperatures
    Physical Review Letters, Vol. 97, No. 7. (2006)
    by JY Huang, S Chen, ZF Ren, ZQ Wang, DZ Wang, M Vaziri, Z Suo, G Chen, MS Dresselhaus
    posted to nanotube plasticity by suo to the group suogroup on 2006-08-25 18:14:13 as **
  • Stress-related problems in silicoin technology
    J. Appl. Phys., Vol. 70, No. 6. (15 September 1991), pp. R53-R80.
    by Hu
    posted to film-edge strainedsi stress by suo to the group suogroup on 2006-08-25 17:03:45 as ****
  • Dislocation dynamics near film edges and corners in silicon
    J. Appl Phys., Vol. 85, No. 10. (15 May 1999), pp. 7198-7208.
    posted to dislocation strainedsi by suo to the group suogroup on 2006-08-25 16:57:19 as **
  • Controlled nucleation of dislocation by a spatially localized stress field
    Applied Physics Letters, Vol. 87 (2005), 133116.
    by M Kammler, D Chidambarrao, KW Schwarz, CT Black, FM Ross
    posted to strainedsi by suo to the group suogroup on 2006-08-25 16:49:14 as *****
  • High-speed strained-single-crystal-silicon thin-film transistors on flexible polymers
    Journal of Applied Physics, Vol. 100, No. 1. (2006)
    by Hao C Yuan, Zhenqiang Ma, Michelle M Roberts, Donald E Savage, Max G Lagally
  • Soft matter with hard skin: From skin wrinkles to templating and material characterization
    posted to wrinkles by suo to the group suogroup on 2006-08-24 15:17:23 as **
  • Effect of barrier thickness on electromigration reliability of Cu/porous low k interconnects
    Applied Physics Letters, Vol. 87, No. 6. (2005)
    by Jung W Pyun, Xia Lu, Jayhoon Chung, Sean Yoon, Paul S Ho, Neil Henis, Kyle Neuman, Larry Smith, Klaus Pfeifer
    posted to electromigartion lowk by suo to the group suogroup on 2006-08-24 13:57:46 as *****
  • Convergent debonding of films and fibers
    Acta Materialia, Vol. 45, No. 8. (August 1997), pp. 3481-3489.
    by MY He, AG Evans, JW Hutchinson
    posted to debond interface by suo to the group suogroup on 2006-07-27 20:50:36 as **
  • Stress evolution due to electromigration in confined metal lines
    Journal of Applied Physics
    by Ma Korhonen, P Bogesen, Kn Tu, Cy Li
    posted to electromigartion by suo to the group suogroup on 2006-07-24 23:32:07 as **
  • Why social networks are different from other types of networks
    (26 May 2003)
    by MEJ Newman, Juyong Park
  • Intellectual Property, Communism and Contextuality
    Science, Technology & Innovation Studies, Vol. 1
    posted to publishing by suo to the group suogroup on 2006-07-24 15:12:28 as **
  • Usage patterns of collaborative tagging systems
    J. Inf. Sci., Vol. 32, No. 2. (April 2006), pp. 198-208.
    by Scott A Golder, Bernardo A Huberman
  • Critical Phenomena in Natural Sciences: Chaos, Fractals, Selforganization and Disorder: Concepts and Tools (Springer Series in Synergetics)
    (11 April 2006)
    by Didier Sornette
  • Steady-state cracking in brittle substrates beneath adherent films
    International Journal of Solids and Structures, Vol. 25, No. 11. (1989), pp. 1337-1353.
    by Zhigang Suo, John W Hutchinson
    posted to crack by suo to the group suogroup on 2006-07-20 18:06:37 as **
  • Singularities interacting with interfaces and cracks
    International Journal of Solids and Structures, Vol. 25, No. 10. (1989), pp. 1133-1142.
    by Zhigang Suo
    posted to crack interface by suo to the group suogroup on 2006-07-20 18:02:02 as ** along with 1 person suopublications
  • Sandwich test specimens for measuring interface crack toughness
    Materials Science and Engineering A, Vol. 107 (January 1989), pp. 135-143.
    by Zhigang Suo, John W Hutchinson
    posted to crack interface by suo to the group suogroup on 2006-07-20 17:51:45 as ** along with 1 person suopublications
  • Deformation and stress from in-pore drying-induced crystallization of salt
    Journal of the Mechanics and Physics of Solids, Vol. 54, No. 8. (August 2006), pp. 1517-1547.
    by Olivier Coussy
    posted to no-tag by suo to the group suogroup on 2006-07-19 17:54:39 as **
  • Cell and Membrane Biology
    posted to membrane by suo to the group suogroup on 2006-07-19 17:54:20 as **
  • The giant electromechanical response in ferroelectric relaxors as a critical phenomenon : Nature
    posted to ferroelectrics by suo to the group suogroup on 2006-07-19 17:53:39 as **
  • Microstructure of thermal hillocks on blanket Al thin films
    Thin Solid Films, Vol. 371, No. 1-2. (1 August 2000), pp. 278-282.
    by Deok-Kee Kim, Birgit Heiland, William D Nix, Eduard Arzt, Michael D Deal, James D Plummer
    posted to hillock by suo to the group suogroup on 2006-07-19 17:53:10 as **
  • Behavior of tin whisker formation and growth on lead-free solder finish
    Thin Solid Films, Vol. 504, No. 1-2. (10 May 2006), pp. 350-354.
    by Kyung-Seob Kim, Chung-Hee Yu, Jun-Mo Yang
    posted to hillock by suo to the group suogroup on 2006-07-19 17:52:51 as **
  • Durability of nanosized oxygen-barrier coatings on polymers
    Progress in Materials Science, Vol. 48, No. 1. (2003), pp. 1-55.
    by Yves Leterrier
  • Coming Together around Library 2.0: A Focus for Discussion and a Call to Arms
    D-Lib Magazine, Vol. 12, No. 4. (April 2006)
    by Paul Miller
    posted to doi library by suo to the group suogroup on 2006-07-18 23:18:01 as ** along with 3 people tomroper LA2 allancho
  • Stress-related problems in silicon technology
    Journal of Applied Physics, Vol. 70, No. 6. (1991), pp. R53-R80.
    by SM Hu
    posted to device stress by suo to the group suogroup on 2006-07-18 23:17:11 as ** along with 3 people kristgy zhenzhang hanss
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