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著者: Spanos [14 articles]

Recent papers posted to CiteULike by the author Spanos.
  • A result on exponential tracking error convergence and persistent excitation
    Automatic Control, IEEE Transactions on, Vol. 43, No. 9. (1998), pp. 1334-1338.
    by DS Bayard, J Spanos, Z Rahman
    posted to adaptive-observer aaron by jford on 2008-07-01 02:59:47 as **
  • Severe Testing as a Basic Concept in a NeymanPearson Philosophy of Induction
    British Journal for the Philosophy of Science, Vol. 57, No. 2. (1 June 2006), pp. 323-357.
    by Mayo, G Deborah, Spanos, Aris
    posted to frequentist bayesian by stringertheory on 2008-05-04 03:04:02 as ** along with 1 person ansobol
  • Control of Mitotic Exit in Budding Yeast. IN VITRO REGULATION OF Tem1 GTPase BY Bub2 AND Bfa1
    J. Biol. Chem., Vol. 277, No. 32. (2 August 2002), pp. 28439-28445.
    by Marco Geymonat, Ad Spanos, Susan J Smith, Edward Wheatley, Katrin Rittinger, Leland H Johnston, Steven G Sedgwick
    posted to mitoticexit by ciclistadan on 2008-02-20 19:44:54 as **
  • World databases of summaries of articles in the biomedical fields.
    Arch Intern Med, Vol. 167, No. 11. (11 June 2007), pp. 1204-1206.
    by ME Falagas, KP Giannopoulou, EA Issaris, A Spanos
    posted to no-tag by jyuh on 2007-07-12 11:31:08 as **
  • Evolution of Mesobuthus gibbosus (Brulle, 1832) (Scorpiones: Buthidae) in the northeastern Mediterranean region
    Molecular Ecology, Vol. 15, No. 10. (September 2006), pp. 2883-2894.
    by A Parmakelis, I Stathi, M Chatzaki, S Simaiakis, L Spanos, C Louis, M Mylonas
    posted to biogeography diversity islands phylogeny plant by taka on 2006-12-30 06:51:44 as ***
  • Update on the Direct Detection of Supersymmetric Dark Matter
    (31 Jan 2005)
    by John Ellis, Keith A Olive, Yudi Santoso, Vassilis C Spanos
    posted to dark-matter supersymmetry by kaixuan on 2006-11-12 22:03:44 as ** along with 1 group XENON
  • Specular spectroscopic scatterometry in DUV lithography
    Metrology, Inspection, and Process Control for Microlithography XIII, Vol. 3677, No. 1. (1999), pp. 159-168.
    by Xinhui Niu, Nickhil H Jakatdar, Junwei Bao, Costas J Spanos, Sanjay K Yedur
    edited by Bhanwar Singh
    posted to metrology scatterometry by eyliu on 2006-11-04 23:45:18 as ** along with 1 person kewms
  • Where do statistical models come from? Revisiting the problem of specification
    (27 Oct 2006)
    by Aris Spanos
    posted to no-tag by proportional on 2006-11-01 22:05:18 as **
  • Revisiting the omitted variables argument: Substantive vs. statistical adequacy
    Journal of Economic Methodology, Vol. 13, No. 2. (June 2006), pp. 179-218.
    by Spanos, Aris
    posted to causal_inference statistics by jake on 2006-09-21 18:46:01 as ** along with 1 group Statistics_and_Social_Science
  • Specular spectroscopic scatterometry
    Semiconductor Manufacturing, IEEE Transactions on, Vol. 14, No. 2. (2001), pp. 97-111.
    by Xinhui Niu, N Jakatdar, Junwei Bao, CJ Spanos
    posted to metrology scatterometry by eyliu on 2006-08-12 03:44:12 as ***
  • Characterization of a positive chemically amplified photoresist for process control
    Metrology, Inspection, and Process Control for Microlithography XII, Vol. 3332, No. 1. (1998), pp. 586-593.
    by Nickhil H Jakatdar, Xinhui Niu, Costas J Spanos, Andrew R Romano, Joseph J Bendik, Ronald P Kovacs, Stephen L Hill
    edited by Bhanwar Singh
    posted to lithography metrology resists by kewms on 2006-06-02 18:58:09 as **
  • Specular spectral profilometry on metal layers
    Metrology, Inspection, and Process Control for Microlithography XIV, Vol. 3998, No. 1. (2000), pp. 882-892.
    by Junwei Bao, Xinhui Niu, Nickhil H Jakatdar, Costas J Spanos, Joseph J Bendik
    edited by Neal T Sullivan
    posted to interconnect metrology scatterometry by kewms on 2006-06-02 18:28:48 as read
  • Spatial modeling of micron-scale gate length variation
    Data Analysis and Modeling for Process Control III, Vol. 6155, No. 1. (2006)
    by Paul Friedberg, Willy Cheung, Costas J Spanos
    edited by Iraj Emami, Kenneth W Tobin, Jr
    posted to critical dimension metrology models by kewms on 2006-05-31 20:36:14 as **
  • Comparing the economic impact of alternative metrology methods in semiconductor manufacturing
    Semiconductor Manufacturing, IEEE Transactions on, Vol. 15, No. 4. (2002), pp. 454-463.
    by P Jula, C Spanos, R Leachman
    posted to control process by kewms on 2005-04-15 23:19:49 as ****
    • 注: このページを引用する時は次のURLでどうぞ: http://www.citeulike.org/author/Spanos

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