Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1 mum n-MOSFET

@article{citeulike:6274, author = {Bufler, F. M. and Schenk, A. and Zechner, C. and Inada, N. and Asahi, Y. and Fichtner, W. }, citeulike-article-id = {6274}, doi = {http://dx.doi.org/10.1080/106551402100012327}, issn = {1065-514X}, journal = {VLSI Design}, month = {January}, number = {4}, pages = {715--720}, posted-at = {}, publisher = {Taylor and Francis Ltd}, title = {Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1 mum n-MOSFET}, url = {http://dx.doi.org/10.1080/106551402100012327}, volume = {15}, year = {2002} }

TY - JOUR ID - citeulike:6274 L3 - citeulike-article-id:6274 TI - Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1 mum n-MOSFET JF - VLSI Design VL - 15 IS - 4 SP - 715 EP - 720 PB - Taylor and Francis Ltd SN - 1065-514X AU - Bufler, FM AU - Schenk, A AU - Zechner, C AU - Inada, N AU - Asahi, Y AU - Fichtner, W PY - 2002/01/01/ UR - http://dx.doi.org/10.1080/106551402100012327 ER -